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TEXEMS: Texture Exemplars for Defect Detection on Random Textured Surfaces / Xianghua Xie; Majid Mirmehdi

IEEE Transactions on Pattern Analysis and Machine Intelligence, Volume: 29, Issue: 8, Pages: 1454 - 1464

Swansea University Author: Xie, Xianghua

Published in: IEEE Transactions on Pattern Analysis and Machine Intelligence
ISBN: 0162-8828
ISSN: 0162-8828
Published: 2007
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa1698
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College: College of Science
Issue: 8
Start Page: 1454
End Page: 1464