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TEXEMS: Texture Exemplars for Defect Detection on Random Textured Surfaces

Xianghua Xie Orcid Logo, Majid Mirmehdi

IEEE Transactions on Pattern Analysis and Machine Intelligence, Volume: 29, Issue: 8, Pages: 1454 - 1464

Swansea University Author: Xianghua Xie Orcid Logo

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Published in: IEEE Transactions on Pattern Analysis and Machine Intelligence
ISSN: 0162-8828
Published: 2007
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URI: https://cronfa.swan.ac.uk/Record/cronfa1698
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College: Faculty of Science and Engineering
Issue: 8
Start Page: 1454
End Page: 1464