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Drift-diffusion and hydrodynamic modeling of current collapse in GaN HEMTs for RF power application

Soroush Faramehr, Karol Kalna Orcid Logo, Petar Igić, Petar Igic Orcid Logo

Semiconductor Science and Technology, Volume: 29, Issue: 2, Start page: 025007

Swansea University Authors: Karol Kalna Orcid Logo, Petar Igic Orcid Logo

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DOI (Published version): 10.1088/0268-1242/29/2/025007

Published in: Semiconductor Science and Technology
Published: 2014
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College: College of Engineering
Issue: 2
Start Page: 025007