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STM/STS investigation of the interaction of Si with atomic scale vacancies on cleaved GaAs / K.S. Teng, P.R. Dunstan, S.P. Wilks, R.H. Williams, Vincent Teng
Applied Surface Science, Volume: 235, Issue: 3, Pages: 313 - 321
Swansea University Author: Vincent Teng
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STM/STS investigation of the interaction of Si with atomic scale vacancies on cleaved GaAs
|Published in:||Applied Surface Science|
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