No Cover Image

Journal article 433 views

STM/STS investigation of the interaction of Si with atomic scale vacancies on cleaved GaAs / K.S. Teng, P.R. Dunstan, S.P. Wilks, R.H. Williams, Vincent Teng

Applied Surface Science, Volume: 235, Issue: 3, Pages: 313 - 321

Swansea University Author: Vincent Teng

Full text not available from this repository: check for access using links below.

Published in: Applied Surface Science
ISSN: 01694332
Published: 2004
Online Access: Check full text

Tags: Add Tag
No Tags, Be the first to tag this record!
College: College of Engineering
Issue: 3
Start Page: 313
End Page: 321