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STM/STS investigation of the interaction of Si with atomic scale vacancies on cleaved GaAs / K.S. Teng, P.R. Dunstan, S.P. Wilks, R.H. Williams, Vincent Teng

Applied Surface Science, Volume: 235, Issue: 3, Pages: 313 - 321

Swansea University Author: Vincent Teng

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Published in: Applied Surface Science
ISSN: 01694332
Published: 2004
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URI: https://cronfa.swan.ac.uk/Record/cronfa31371
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College: College of Engineering
Issue: 3
Start Page: 313
End Page: 321