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The passivation of atomic scale defects present on III–V semiconductor laser facets: an STM/STS investigation / S.P. Wilks, K.S. Teng, P.R. Dunstan, R.H. Williams, Vincent Teng

Applied Surface Science, Volume: 190, Issue: 1-4, Pages: 467 - 474

Swansea University Author: Vincent Teng

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Published in: Applied Surface Science
ISSN: 01694332
Published: 2002
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa31376
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College: College of Engineering
Issue: 1-4
Start Page: 467
End Page: 474