Journal article 1243 views
The passivation of atomic scale defects present on III–V semiconductor laser facets: an STM/STS investigation
S.P. Wilks,
K.S. Teng,
P.R. Dunstan,
R.H. Williams,
Vincent Teng 
Applied Surface Science, Volume: 190, Issue: 1-4, Pages: 467 - 474
Swansea University Author:
Vincent Teng
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1016/S0169-4332(01)00920-5
Abstract
The passivation of atomic scale defects present on III–V semiconductor laser facets: an STM/STS investigation
| Published in: | Applied Surface Science |
|---|---|
| ISSN: | 01694332 |
| Published: |
2002
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa31376 |
| College: |
Faculty of Science and Engineering |
|---|---|
| Issue: |
1-4 |
| Start Page: |
467 |
| End Page: |
474 |