No Cover Image

Journal article 917 views

The passivation of atomic scale defects present on III–V semiconductor laser facets: an STM/STS investigation

S.P. Wilks, K.S. Teng, P.R. Dunstan, R.H. Williams, Vincent Teng Orcid Logo

Applied Surface Science, Volume: 190, Issue: 1-4, Pages: 467 - 474

Swansea University Author: Vincent Teng Orcid Logo

Full text not available from this repository: check for access using links below.

Check full text

DOI (Published version): 10.1016/S0169-4332(01)00920-5

Published in: Applied Surface Science
ISSN: 01694332
Published: 2002
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa31376
Tags: Add Tag
No Tags, Be the first to tag this record!
first_indexed 2016-12-06T20:37:53Z
last_indexed 2018-02-09T05:18:13Z
id cronfa31376
recordtype SURis
fullrecord <?xml version="1.0"?><rfc1807><datestamp>2016-12-06T17:08:51.1232417</datestamp><bib-version>v2</bib-version><id>31376</id><entry>2016-12-06</entry><title>The passivation of atomic scale defects present on III&#x2013;V semiconductor laser facets: an STM/STS investigation</title><swanseaauthors><author><sid>98f529f56798da1ba3e6e93d2817c114</sid><ORCID>0000-0003-4325-8573</ORCID><firstname>Vincent</firstname><surname>Teng</surname><name>Vincent Teng</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2016-12-06</date><deptcode>EEEG</deptcode><abstract/><type>Journal Article</type><journal>Applied Surface Science</journal><volume>190</volume><journalNumber>1-4</journalNumber><paginationStart>467</paginationStart><paginationEnd>474</paginationEnd><publisher/><placeOfPublication/><isbnPrint/><isbnElectronic/><issnPrint>01694332</issnPrint><issnElectronic/><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2002</publishedYear><publishedDate>2002-12-31</publishedDate><doi>10.1016/S0169-4332(01)00920-5</doi><url/><notes/><college>COLLEGE NANME</college><department>Electronic and Electrical Engineering</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>EEEG</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2016-12-06T17:08:51.1232417</lastEdited><Created>2016-12-06T17:08:51.1232417</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering</level></path><authors><author><firstname>S.P.</firstname><surname>Wilks</surname><order>1</order></author><author><firstname>K.S.</firstname><surname>Teng</surname><order>2</order></author><author><firstname>P.R.</firstname><surname>Dunstan</surname><order>3</order></author><author><firstname>R.H.</firstname><surname>Williams</surname><order>4</order></author><author><firstname>Vincent</firstname><surname>Teng</surname><orcid>0000-0003-4325-8573</orcid><order>5</order></author></authors><documents/><OutputDurs/></rfc1807>
spelling 2016-12-06T17:08:51.1232417 v2 31376 2016-12-06 The passivation of atomic scale defects present on III–V semiconductor laser facets: an STM/STS investigation 98f529f56798da1ba3e6e93d2817c114 0000-0003-4325-8573 Vincent Teng Vincent Teng true false 2016-12-06 EEEG Journal Article Applied Surface Science 190 1-4 467 474 01694332 31 12 2002 2002-12-31 10.1016/S0169-4332(01)00920-5 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2016-12-06T17:08:51.1232417 2016-12-06T17:08:51.1232417 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering S.P. Wilks 1 K.S. Teng 2 P.R. Dunstan 3 R.H. Williams 4 Vincent Teng 0000-0003-4325-8573 5
title The passivation of atomic scale defects present on III–V semiconductor laser facets: an STM/STS investigation
spellingShingle The passivation of atomic scale defects present on III–V semiconductor laser facets: an STM/STS investigation
Vincent Teng
title_short The passivation of atomic scale defects present on III–V semiconductor laser facets: an STM/STS investigation
title_full The passivation of atomic scale defects present on III–V semiconductor laser facets: an STM/STS investigation
title_fullStr The passivation of atomic scale defects present on III–V semiconductor laser facets: an STM/STS investigation
title_full_unstemmed The passivation of atomic scale defects present on III–V semiconductor laser facets: an STM/STS investigation
title_sort The passivation of atomic scale defects present on III–V semiconductor laser facets: an STM/STS investigation
author_id_str_mv 98f529f56798da1ba3e6e93d2817c114
author_id_fullname_str_mv 98f529f56798da1ba3e6e93d2817c114_***_Vincent Teng
author Vincent Teng
author2 S.P. Wilks
K.S. Teng
P.R. Dunstan
R.H. Williams
Vincent Teng
format Journal article
container_title Applied Surface Science
container_volume 190
container_issue 1-4
container_start_page 467
publishDate 2002
institution Swansea University
issn 01694332
doi_str_mv 10.1016/S0169-4332(01)00920-5
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering
document_store_str 0
active_str 0
published_date 2002-12-31T03:38:20Z
_version_ 1763751703719444480
score 11.01628

Similar Items