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Electron velocity decline in Si nanoscales MOSFETs with the shortening of gate length

Karol Kalna Orcid Logo

Journal of Physics: Conference Series

Swansea University Author: Karol Kalna Orcid Logo

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DOI (Published version): 10.1088/1742-6596/242/1/012011

Published in: Journal of Physics: Conference Series
Published: 2010
URI: https://cronfa.swan.ac.uk/Record/cronfa6069
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College: College of Engineering