Journal article 1049 views
Electron velocity decline in Si nanoscales MOSFETs with the shortening of gate length
Journal of Physics: Conference Series
Swansea University Author: Karol Kalna
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DOI (Published version): 10.1088/1742-6596/242/1/012011
Abstract
Electron velocity decline in Si nanoscales MOSFETs with the shortening of gate length
Published in: | Journal of Physics: Conference Series |
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Published: |
2010
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URI: | https://cronfa.swan.ac.uk/Record/cronfa6069 |
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<?xml version="1.0"?><rfc1807><datestamp>2011-10-01T00:00:00.0000000</datestamp><bib-version>v2</bib-version><id>6069</id><entry>2013-09-03</entry><title>Electron velocity decline in Si nanoscales MOSFETs with the shortening of gate length</title><swanseaauthors><author><sid>1329a42020e44fdd13de2f20d5143253</sid><ORCID>0000-0002-6333-9189</ORCID><firstname>Karol</firstname><surname>Kalna</surname><name>Karol Kalna</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2013-09-03</date><deptcode>EEEG</deptcode><abstract></abstract><type>Journal Article</type><journal>Journal of Physics: Conference Series</journal><volume></volume><journalNumber></journalNumber><paginationStart/><paginationEnd/><publisher/><placeOfPublication/><issnPrint/><issnElectronic/><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2010</publishedYear><publishedDate>2010-12-31</publishedDate><doi>10.1088/1742-6596/242/1/012011</doi><url/><notes/><college>COLLEGE NANME</college><department>Electronic and Electrical Engineering</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>EEEG</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2011-10-01T00:00:00.0000000</lastEdited><Created>2013-09-03T06:36:19.0000000</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering</level></path><authors><author><firstname>Karol</firstname><surname>Kalna</surname><orcid>0000-0002-6333-9189</orcid><order>1</order></author></authors><documents/><OutputDurs/></rfc1807> |
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2011-10-01T00:00:00.0000000 v2 6069 2013-09-03 Electron velocity decline in Si nanoscales MOSFETs with the shortening of gate length 1329a42020e44fdd13de2f20d5143253 0000-0002-6333-9189 Karol Kalna Karol Kalna true false 2013-09-03 EEEG Journal Article Journal of Physics: Conference Series 31 12 2010 2010-12-31 10.1088/1742-6596/242/1/012011 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2011-10-01T00:00:00.0000000 2013-09-03T06:36:19.0000000 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering Karol Kalna 0000-0002-6333-9189 1 |
title |
Electron velocity decline in Si nanoscales MOSFETs with the shortening of gate length |
spellingShingle |
Electron velocity decline in Si nanoscales MOSFETs with the shortening of gate length Karol Kalna |
title_short |
Electron velocity decline in Si nanoscales MOSFETs with the shortening of gate length |
title_full |
Electron velocity decline in Si nanoscales MOSFETs with the shortening of gate length |
title_fullStr |
Electron velocity decline in Si nanoscales MOSFETs with the shortening of gate length |
title_full_unstemmed |
Electron velocity decline in Si nanoscales MOSFETs with the shortening of gate length |
title_sort |
Electron velocity decline in Si nanoscales MOSFETs with the shortening of gate length |
author_id_str_mv |
1329a42020e44fdd13de2f20d5143253 |
author_id_fullname_str_mv |
1329a42020e44fdd13de2f20d5143253_***_Karol Kalna |
author |
Karol Kalna |
author2 |
Karol Kalna |
format |
Journal article |
container_title |
Journal of Physics: Conference Series |
publishDate |
2010 |
institution |
Swansea University |
doi_str_mv |
10.1088/1742-6596/242/1/012011 |
college_str |
Faculty of Science and Engineering |
hierarchytype |
|
hierarchy_top_id |
facultyofscienceandengineering |
hierarchy_top_title |
Faculty of Science and Engineering |
hierarchy_parent_id |
facultyofscienceandengineering |
hierarchy_parent_title |
Faculty of Science and Engineering |
department_str |
School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering |
document_store_str |
0 |
active_str |
0 |
published_date |
2010-12-31T03:07:27Z |
_version_ |
1763749761038417920 |
score |
11.035349 |