Journal article 17 views
Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy
Chen Chen ,
Saptarsi Ghosh ,
Peter De Wolf ,
Zhida Liang ,
Francesca Adams ,
Menno J. Kappers ,
David J. Wallis ,
Rachel A. Oliver
Applied Physics Letters, Volume: 124, Issue: 23
Swansea University Author: Saptarsi Ghosh
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DOI (Published version): 10.1063/5.0203646
Abstract
Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy
Published in: | Applied Physics Letters |
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ISSN: | 0003-6951 1077-3118 |
Published: |
AIP Publishing
2024
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Online Access: |
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URI: | https://cronfa.swan.ac.uk/Record/cronfa66864 |
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College: |
Faculty of Science and Engineering |
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Issue: |
23 |