Journal article 17 views
Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy
Chen Chen 
,
Saptarsi Ghosh ,
Peter De Wolf ,
Zhida Liang ,
Francesca Adams ,
Menno J. Kappers ,
David J. Wallis ,
Rachel A. Oliver
,
Saptarsi Ghosh ,
Peter De Wolf ,
Zhida Liang ,
Francesca Adams ,
Menno J. Kappers ,
David J. Wallis ,
Rachel A. Oliver
Applied Physics Letters, Volume: 124, Issue: 23
Swansea University Author:
Saptarsi Ghosh
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DOI (Published version): 10.1063/5.0203646
Abstract
Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy
| Published in: | Applied Physics Letters |
|---|---|
| ISSN: | 0003-6951 1077-3118 |
| Published: |
AIP Publishing
2024
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| Online Access: |
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa66864 |
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| College: |
Faculty of Science and Engineering |
|---|---|
| Issue: |
23 |