Journal article 17 views
Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy
Chen Chen
,
Saptarsi Ghosh
,
Peter De Wolf
,
Zhida Liang
,
Francesca Adams
,
Menno J. Kappers
,
David J. Wallis
,
Rachel A. Oliver
Applied Physics Letters, Volume: 124, Issue: 23
Swansea University Author:
Saptarsi Ghosh
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1063/5.0203646
Abstract
Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy
Published in: | Applied Physics Letters |
---|---|
ISSN: | 0003-6951 1077-3118 |
Published: |
AIP Publishing
2024
|
Online Access: |
Check full text
|
URI: | https://cronfa.swan.ac.uk/Record/cronfa66864 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
first_indexed |
2024-07-04T16:50:34Z |
---|---|
last_indexed |
2024-07-04T16:50:34Z |
id |
cronfa66864 |
recordtype |
SURis |
fullrecord |
<?xml version="1.0" encoding="utf-8"?><rfc1807 xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:xsd="http://www.w3.org/2001/XMLSchema"><bib-version>v2</bib-version><id>66864</id><entry>2024-06-23</entry><title>Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy</title><swanseaauthors><author><sid>3e247ecabd6eddd319264d066b0ce959</sid><ORCID>0000-0003-1685-6228</ORCID><firstname>Saptarsi</firstname><surname>Ghosh</surname><name>Saptarsi Ghosh</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2024-06-23</date><deptcode>ACEM</deptcode><abstract/><type>Journal Article</type><journal>Applied Physics Letters</journal><volume>124</volume><journalNumber>23</journalNumber><paginationStart/><paginationEnd/><publisher>AIP Publishing</publisher><placeOfPublication/><isbnPrint/><isbnElectronic/><issnPrint>0003-6951</issnPrint><issnElectronic>1077-3118</issnElectronic><keywords/><publishedDay>3</publishedDay><publishedMonth>6</publishedMonth><publishedYear>2024</publishedYear><publishedDate>2024-06-03</publishedDate><doi>10.1063/5.0203646</doi><url>http://dx.doi.org/10.1063/5.0203646</url><notes/><college>COLLEGE NANME</college><department>Aerospace, Civil, Electrical, and Mechanical Engineering</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>ACEM</DepartmentCode><institution>Swansea University</institution><apcterm/><funders/><projectreference/><lastEdited>2024-07-04T17:50:36.2414481</lastEdited><Created>2024-06-23T19:46:58.8891727</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering</level></path><authors><author><firstname>Chen</firstname><surname>Chen</surname><orcid>0000-0001-9931-2650</orcid><order>1</order></author><author><firstname>Saptarsi</firstname><surname>Ghosh</surname><orcid>0000-0003-1685-6228</orcid><order>2</order></author><author><firstname>Peter De</firstname><surname>Wolf</surname><orcid>0009-0005-7178-6228</orcid><order>3</order></author><author><firstname>Zhida</firstname><surname>Liang</surname><orcid>0000-0001-8265-7599</orcid><order>4</order></author><author><firstname>Francesca</firstname><surname>Adams</surname><orcid>0009-0008-2033-2121</orcid><order>5</order></author><author><firstname>Menno J.</firstname><surname>Kappers</surname><orcid>0000-0002-6566-0742</orcid><order>6</order></author><author><firstname>David J.</firstname><surname>Wallis</surname><orcid>0000-0002-0475-7583</orcid><order>7</order></author><author><firstname>Rachel A.</firstname><surname>Oliver</surname><orcid>0000-0003-0029-3993</orcid><order>8</order></author></authors><documents/><OutputDurs/></rfc1807> |
spelling |
v2 66864 2024-06-23 Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy 3e247ecabd6eddd319264d066b0ce959 0000-0003-1685-6228 Saptarsi Ghosh Saptarsi Ghosh true false 2024-06-23 ACEM Journal Article Applied Physics Letters 124 23 AIP Publishing 0003-6951 1077-3118 3 6 2024 2024-06-03 10.1063/5.0203646 http://dx.doi.org/10.1063/5.0203646 COLLEGE NANME Aerospace, Civil, Electrical, and Mechanical Engineering COLLEGE CODE ACEM Swansea University 2024-07-04T17:50:36.2414481 2024-06-23T19:46:58.8891727 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering Chen Chen 0000-0001-9931-2650 1 Saptarsi Ghosh 0000-0003-1685-6228 2 Peter De Wolf 0009-0005-7178-6228 3 Zhida Liang 0000-0001-8265-7599 4 Francesca Adams 0009-0008-2033-2121 5 Menno J. Kappers 0000-0002-6566-0742 6 David J. Wallis 0000-0002-0475-7583 7 Rachel A. Oliver 0000-0003-0029-3993 8 |
title |
Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy |
spellingShingle |
Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy Saptarsi Ghosh |
title_short |
Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy |
title_full |
Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy |
title_fullStr |
Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy |
title_full_unstemmed |
Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy |
title_sort |
Threshold voltage mapping at the nanoscale of GaN-based high electron mobility transistor structures using hyperspectral scanning capacitance microscopy |
author_id_str_mv |
3e247ecabd6eddd319264d066b0ce959 |
author_id_fullname_str_mv |
3e247ecabd6eddd319264d066b0ce959_***_Saptarsi Ghosh |
author |
Saptarsi Ghosh |
author2 |
Chen Chen Saptarsi Ghosh Peter De Wolf Zhida Liang Francesca Adams Menno J. Kappers David J. Wallis Rachel A. Oliver |
format |
Journal article |
container_title |
Applied Physics Letters |
container_volume |
124 |
container_issue |
23 |
publishDate |
2024 |
institution |
Swansea University |
issn |
0003-6951 1077-3118 |
doi_str_mv |
10.1063/5.0203646 |
publisher |
AIP Publishing |
college_str |
Faculty of Science and Engineering |
hierarchytype |
|
hierarchy_top_id |
facultyofscienceandengineering |
hierarchy_top_title |
Faculty of Science and Engineering |
hierarchy_parent_id |
facultyofscienceandengineering |
hierarchy_parent_title |
Faculty of Science and Engineering |
department_str |
School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering |
url |
http://dx.doi.org/10.1063/5.0203646 |
document_store_str |
0 |
active_str |
0 |
published_date |
2024-06-03T17:50:34Z |
_version_ |
1803667986977914880 |
score |
11.01438 |