Journal article 15 views
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide
Chen Chen 
,
Saptarsi Ghosh ,
Francesca Adams,
Menno J. Kappers,
David J. Wallis,
Rachel A. Oliver
,
Saptarsi Ghosh ,
Francesca Adams,
Menno J. Kappers,
David J. Wallis,
Rachel A. Oliver
Ultramicroscopy, Volume: 254, Start page: 113833
Swansea University Author:
Saptarsi Ghosh
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1016/j.ultramic.2023.113833
Abstract
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide
| Published in: | Ultramicroscopy |
|---|---|
| ISSN: | 0304-3991 |
| Published: |
Elsevier BV
2023
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa66866 |
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| College: |
Faculty of Science and Engineering |
|---|---|
| Start Page: |
113833 |