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Full-band NEGF simulations of surface roughness in Si nanowires

Antonio Martinez Muniz, Antonio Martinez Muniz Orcid Logo

Journal of Physics: Conference Series, Volume: 242

Swansea University Author: Antonio Martinez Muniz Orcid Logo

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DOI (Published version): 10.1088/1742-6596/242/1/012016

Published in: Journal of Physics: Conference Series
Published: 2010
URI: https://cronfa.swan.ac.uk/Record/cronfa10564
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College: College of Engineering