No Cover Image

Journal article 580 views

Investigation of resistance in n-doped Si wires using NEGF formalism

Antonio Martinez Muniz, Antonio Martinez Muniz Orcid Logo

Swansea University Author: Antonio Martinez Muniz Orcid Logo

Full text not available from this repository: check for access using links below.

DOI (Published version): 10.1109/sced.2009.4800522

Published: 2009
URI: https://cronfa.swan.ac.uk/Record/cronfa10585
Tags: Add Tag
No Tags, Be the first to tag this record!
College: College of Engineering