No Cover Image

Journal article 1059 views

Statistical study of the influence of LER and MGG in SOI MOSFET

G Indalecio, M Aldegunde, N Seoane, K Kalna, A J García-Loureiro, Karol Kalna Orcid Logo

Semiconductor Science and Technology, Volume: 29, Issue: 4, Start page: 045005

Swansea University Author: Karol Kalna Orcid Logo

Full text not available from this repository: check for access using links below.

DOI (Published version): 10.1088/0268-1242/29/4/045005

Published in: Semiconductor Science and Technology
Published: 2014
URI: https://cronfa.swan.ac.uk/Record/cronfa21851
Tags: Add Tag
No Tags, Be the first to tag this record!
College: Faculty of Science and Engineering
Issue: 4
Start Page: 045005