Conference Paper/Proceeding/Abstract 765 views
Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG
G Indalecio,
A Garcia-Loureiro,
M Aldegunde,
K Kalna,
Karol Kalna 
Pages: 95 - 98
Swansea University Author:
Karol Kalna
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DOI (Published version): 10.1109/cde.2013.6481351
Abstract
Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG
| Published: |
2013
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa14752 |
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| College: |
Faculty of Science and Engineering |
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| Start Page: |
95 |
| End Page: |
98 |