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Conference Paper/Proceeding/Abstract 585 views

Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG

G Indalecio, A Garcia-Loureiro, M Aldegunde, K Kalna, Karol Kalna Orcid Logo

Pages: 95 - 98

Swansea University Author: Karol Kalna Orcid Logo

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DOI (Published version): 10.1109/cde.2013.6481351

Published: 2013
URI: https://cronfa.swan.ac.uk/Record/cronfa14752
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College: College of Engineering
Start Page: 95
End Page: 98