Conference Paper/Proceeding/Abstract 766 views
Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG
Pages: 95 - 98
Swansea University Author:
Karol Kalna
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DOI (Published version): 10.1109/cde.2013.6481351
Abstract
Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG
Published: |
2013
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URI: | https://cronfa.swan.ac.uk/Record/cronfa14752 |
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College: |
Faculty of Science and Engineering |
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Start Page: |
95 |
End Page: |
98 |