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Journal article 1374 views

Variability Characterisation of Nanoscale Si and InGaAs Fin Field-Effect-Transistors at Subthreshold

G. Indalecio, N. Seoane, M. Aldegunde, K. Kalna, A. J. García-Loureiro, Karol Kalna Orcid Logo

Journal of Low Power Electronics, Volume: 11, Issue: 2, Pages: 256 - 262

Swansea University Author: Karol Kalna Orcid Logo

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DOI (Published version): 10.1166/jolpe.2015.1371

Published in: Journal of Low Power Electronics
Published: 2015
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College: Faculty of Science and Engineering
Issue: 2
Start Page: 256
End Page: 262