Random Dopant, Line-Edge Roughness, and Gate Workfunction Variability in a Nano InGaAs FinFET
| Date first appeared online | |
| DOI | 10.1109/TED.2013.2294213 |
| Authors | Kalna K. |
| Journal Name | IEEE Transactions on Electron Devices |
| Volume | 61 |
| Date first appeared online | |
| DOI | 10.1109/TED.2013.2294213 |
| Authors | Kalna K. |
| Journal Name | IEEE Transactions on Electron Devices |
| Volume | 61 |