No Cover Image

Conference Paper/Proceeding/Abstract 786 views

Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG

G Indalecio, A Garcia-Loureiro, M Aldegunde, K Kalna, Karol Kalna Orcid Logo

Pages: 95 - 98

Swansea University Author: Karol Kalna Orcid Logo

Full text not available from this repository: check for access using links below.

DOI (Published version): 10.1109/cde.2013.6481351

Published: 2013
URI: https://cronfa.swan.ac.uk/Record/cronfa14752
Tags: Add Tag
No Tags, Be the first to tag this record!
first_indexed 2013-07-23T12:13:31Z
last_indexed 2018-02-09T04:46:20Z
id cronfa14752
recordtype SURis
fullrecord <?xml version="1.0"?><rfc1807><datestamp>2013-05-30T11:57:01.1356891</datestamp><bib-version>v2</bib-version><id>14752</id><entry>2013-09-03</entry><title>Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG</title><swanseaauthors><author><sid>1329a42020e44fdd13de2f20d5143253</sid><ORCID>0000-0002-6333-9189</ORCID><firstname>Karol</firstname><surname>Kalna</surname><name>Karol Kalna</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2013-09-03</date><deptcode>EEEG</deptcode><abstract></abstract><type>Conference Paper/Proceeding/Abstract</type><journal></journal><volume></volume><journalNumber></journalNumber><paginationStart>95</paginationStart><paginationEnd>98</paginationEnd><publisher/><placeOfPublication/><issnPrint/><issnElectronic/><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2013</publishedYear><publishedDate>2013-12-31</publishedDate><doi>10.1109/cde.2013.6481351</doi><url/><notes/><college>COLLEGE NANME</college><department>Electronic and Electrical Engineering</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>EEEG</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2013-05-30T11:57:01.1356891</lastEdited><Created>2013-09-03T06:36:47.0000000</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering</level></path><authors><author><firstname>G</firstname><surname>Indalecio</surname><order>1</order></author><author><firstname>A</firstname><surname>Garcia-Loureiro</surname><order>2</order></author><author><firstname>M</firstname><surname>Aldegunde</surname><order>3</order></author><author><firstname>K</firstname><surname>Kalna</surname><order>4</order></author><author><firstname>Karol</firstname><surname>Kalna</surname><orcid>0000-0002-6333-9189</orcid><order>5</order></author></authors><documents/><OutputDurs/></rfc1807>
spelling 2013-05-30T11:57:01.1356891 v2 14752 2013-09-03 Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG 1329a42020e44fdd13de2f20d5143253 0000-0002-6333-9189 Karol Kalna Karol Kalna true false 2013-09-03 EEEG Conference Paper/Proceeding/Abstract 95 98 31 12 2013 2013-12-31 10.1109/cde.2013.6481351 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2013-05-30T11:57:01.1356891 2013-09-03T06:36:47.0000000 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering G Indalecio 1 A Garcia-Loureiro 2 M Aldegunde 3 K Kalna 4 Karol Kalna 0000-0002-6333-9189 5
title Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG
spellingShingle Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG
Karol Kalna
title_short Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG
title_full Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG
title_fullStr Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG
title_full_unstemmed Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG
title_sort Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG
author_id_str_mv 1329a42020e44fdd13de2f20d5143253
author_id_fullname_str_mv 1329a42020e44fdd13de2f20d5143253_***_Karol Kalna
author Karol Kalna
author2 G Indalecio
A Garcia-Loureiro
M Aldegunde
K Kalna
Karol Kalna
format Conference Paper/Proceeding/Abstract
container_start_page 95
publishDate 2013
institution Swansea University
doi_str_mv 10.1109/cde.2013.6481351
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering
document_store_str 0
active_str 0
published_date 2013-12-31T03:16:54Z
_version_ 1763750355158433792
score 11.028886

Similar Items