Journal article 21 views
Method for inferring the mechanical strain of GaN-on-Si epitaxial layers using optical profilometry and finite element analysis
B. F. Spiridon,
M. Toon,
A. Hinz,
Saptarsi Ghosh 
,
S. M. Fairclough,
B. J. E. Guilhabert ,
M. J. Strain ,
I. M. Watson,
M. D. Dawson ,
D. J. Wallis,
R. A. Oliver
,
S. M. Fairclough,
B. J. E. Guilhabert ,
M. J. Strain ,
I. M. Watson,
M. D. Dawson ,
D. J. Wallis,
R. A. Oliver
Optical Materials Express, Volume: 11, Issue: 6, Start page: 1643
Swansea University Author:
Saptarsi Ghosh
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1364/ome.418728
Abstract
Method for inferring the mechanical strain of GaN-on-Si epitaxial layers using optical profilometry and finite element analysis
| Published in: | Optical Materials Express |
|---|---|
| ISSN: | 2159-3930 |
| Published: |
Optica Publishing Group
2021
|
| Online Access: |
Check full text
|
| URI: | https://cronfa.swan.ac.uk/Record/cronfa66875 |
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| College: |
Faculty of Science and Engineering |
|---|---|
| Issue: |
6 |
| Start Page: |
1643 |