Journal article 21 views
Method for inferring the mechanical strain of GaN-on-Si epitaxial layers using optical profilometry and finite element analysis
B. F. Spiridon,
M. Toon,
A. Hinz,
Saptarsi Ghosh
,
S. M. Fairclough,
B. J. E. Guilhabert
,
M. J. Strain
,
I. M. Watson,
M. D. Dawson
,
D. J. Wallis,
R. A. Oliver
Optical Materials Express, Volume: 11, Issue: 6, Start page: 1643
Swansea University Author:
Saptarsi Ghosh
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DOI (Published version): 10.1364/ome.418728
Abstract
Method for inferring the mechanical strain of GaN-on-Si epitaxial layers using optical profilometry and finite element analysis
Published in: | Optical Materials Express |
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ISSN: | 2159-3930 |
Published: |
Optica Publishing Group
2021
|
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URI: | https://cronfa.swan.ac.uk/Record/cronfa66875 |
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v2 66875 2024-06-23 Method for inferring the mechanical strain of GaN-on-Si epitaxial layers using optical profilometry and finite element analysis 3e247ecabd6eddd319264d066b0ce959 0000-0003-1685-6228 Saptarsi Ghosh Saptarsi Ghosh true false 2024-06-23 ACEM Journal Article Optical Materials Express 11 6 1643 Optica Publishing Group 2159-3930 1 6 2021 2021-06-01 10.1364/ome.418728 http://dx.doi.org/10.1364/ome.418728 COLLEGE NANME Aerospace, Civil, Electrical, and Mechanical Engineering COLLEGE CODE ACEM Swansea University 2024-07-04T17:54:48.7433551 2024-06-23T20:02:52.7852708 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering B. F. Spiridon 1 M. Toon 2 A. Hinz 3 Saptarsi Ghosh 0000-0003-1685-6228 4 S. M. Fairclough 5 B. J. E. Guilhabert 0000-0002-3986-8566 6 M. J. Strain 0000-0002-9752-3144 7 I. M. Watson 8 M. D. Dawson 0000-0002-6639-2989 9 D. J. Wallis 10 R. A. Oliver 11 |
title |
Method for inferring the mechanical strain of GaN-on-Si epitaxial layers using optical profilometry and finite element analysis |
spellingShingle |
Method for inferring the mechanical strain of GaN-on-Si epitaxial layers using optical profilometry and finite element analysis Saptarsi Ghosh |
title_short |
Method for inferring the mechanical strain of GaN-on-Si epitaxial layers using optical profilometry and finite element analysis |
title_full |
Method for inferring the mechanical strain of GaN-on-Si epitaxial layers using optical profilometry and finite element analysis |
title_fullStr |
Method for inferring the mechanical strain of GaN-on-Si epitaxial layers using optical profilometry and finite element analysis |
title_full_unstemmed |
Method for inferring the mechanical strain of GaN-on-Si epitaxial layers using optical profilometry and finite element analysis |
title_sort |
Method for inferring the mechanical strain of GaN-on-Si epitaxial layers using optical profilometry and finite element analysis |
author_id_str_mv |
3e247ecabd6eddd319264d066b0ce959 |
author_id_fullname_str_mv |
3e247ecabd6eddd319264d066b0ce959_***_Saptarsi Ghosh |
author |
Saptarsi Ghosh |
author2 |
B. F. Spiridon M. Toon A. Hinz Saptarsi Ghosh S. M. Fairclough B. J. E. Guilhabert M. J. Strain I. M. Watson M. D. Dawson D. J. Wallis R. A. Oliver |
format |
Journal article |
container_title |
Optical Materials Express |
container_volume |
11 |
container_issue |
6 |
container_start_page |
1643 |
publishDate |
2021 |
institution |
Swansea University |
issn |
2159-3930 |
doi_str_mv |
10.1364/ome.418728 |
publisher |
Optica Publishing Group |
college_str |
Faculty of Science and Engineering |
hierarchytype |
|
hierarchy_top_id |
facultyofscienceandengineering |
hierarchy_top_title |
Faculty of Science and Engineering |
hierarchy_parent_id |
facultyofscienceandengineering |
hierarchy_parent_title |
Faculty of Science and Engineering |
department_str |
School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering |
url |
http://dx.doi.org/10.1364/ome.418728 |
document_store_str |
0 |
active_str |
0 |
published_date |
2021-06-01T17:54:46Z |
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1803668251639545856 |
score |
11.01438 |