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Real-time detection of probe loss in atomic force microscopy / T. De; P. Agarwal; D.R. Sahoo; M.V. Salapaka

Applied Physics Letters, Volume: 89, Issue: 13, Start page: 133119

Swansea University Author: Sahoo, Deepak

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DOI (Published version): 10.1063/1.2357876

Published in: Applied Physics Letters
ISSN: 0003-6951 1077-3118
Published: 2006
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URI: https://cronfa.swan.ac.uk/Record/cronfa32168
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College: College of Science
Issue: 13
Start Page: 133119