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An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy / DR Sahoo; A Sebastian; MV Salapaka; M Laudon; B Romanowicz

Nsti Nanotech 2004, Vol 3, Technical Proceedings

Swansea University Author: Sahoo, Deepak

Published in: Nsti Nanotech 2004, Vol 3, Technical Proceedings
Published: 2004
Online Access: http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000223078200004&KeyUID=WOS:000223078200004
URI: https://cronfa.swan.ac.uk/Record/cronfa38931
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College: College of Science