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An Observer Based Sample Detection Scheme for Atomic Force Microscopy / A. Sebastian; D.R. Sahoo; M.V. Salapaka

Proceedings of the IEEE Conference on Decision and Control, Volume: 3

Swansea University Author: Sahoo, Deepak

Published in: Proceedings of the IEEE Conference on Decision and Control
Published: 2003
Online Access: http://www.scopus.com/inward/record.url?eid=2-s2.0-1542349121&partnerID=MN8TOARS
URI: https://cronfa.swan.ac.uk/Record/cronfa38932
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College: College of Science