Conference Paper/Proceeding/Abstract 879 views
Observer based imaging methods for atomic force microscopy
Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05, Volume: 2005
Swansea University Author:
Deepak Sahoo
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DOI (Published version): 10.1109/CDC.2005.1582319
Abstract
Observer based imaging methods for atomic force microscopy
Published in: | Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05 |
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Published: |
2005
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Online Access: |
http://www.scopus.com/inward/record.url?eid=2-s2.0-33847205755&partnerID=MN8TOARS |
URI: | https://cronfa.swan.ac.uk/Record/cronfa32170 |
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College: |
Faculty of Science and Engineering |
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