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Observer based imaging methods for atomic force microscopy / D.R. Sahoo; T. De; M.V. Salapaka

Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05, Volume: 2005

Swansea University Author: Sahoo, Deepak

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DOI (Published version): 10.1109/CDC.2005.1582319

Published in: Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05
Published: 2005
Online Access: http://www.scopus.com/inward/record.url?eid=2-s2.0-33847205755&partnerID=MN8TOARS
URI: https://cronfa.swan.ac.uk/Record/cronfa32170
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College: College of Science