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Harnessing the transient signals in atomic force microscopy / D.R. Sahoo; A. Sebastian; M.V. Salapaka

International Journal of Robust and Nonlinear Control, Volume: 15, Issue: 16, Pages: 805 - 820

Swansea University Author: Sahoo, Deepak

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DOI (Published version): 10.1002/rnc.1025

Published in: International Journal of Robust and Nonlinear Control
ISSN: 1049-8923 1099-1239
Published: 2005
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URI: https://cronfa.swan.ac.uk/Record/cronfa32169
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College: College of Science
Issue: 16
Start Page: 805
End Page: 820