Journal article 948 views
Harnessing the transient signals in atomic force microscopy
D.R. Sahoo,
A. Sebastian,
M.V. Salapaka,
Deepak Sahoo 
International Journal of Robust and Nonlinear Control, Volume: 15, Issue: 16, Pages: 805 - 820
Swansea University Author:
Deepak Sahoo
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1002/rnc.1025
Abstract
Harnessing the transient signals in atomic force microscopy
| Published in: | International Journal of Robust and Nonlinear Control |
|---|---|
| ISSN: | 1049-8923 1099-1239 |
| Published: |
2005
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa32169 |
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| College: |
Faculty of Science and Engineering |
|---|---|
| Issue: |
16 |
| Start Page: |
805 |
| End Page: |
820 |