Journal article 887 views
Harnessing the transient signals in atomic force microscopy
International Journal of Robust and Nonlinear Control, Volume: 15, Issue: 16, Pages: 805 - 820
Swansea University Author:
Deepak Sahoo
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DOI (Published version): 10.1002/rnc.1025
Abstract
Harnessing the transient signals in atomic force microscopy
Published in: | International Journal of Robust and Nonlinear Control |
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ISSN: | 1049-8923 1099-1239 |
Published: |
2005
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Online Access: |
Check full text
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URI: | https://cronfa.swan.ac.uk/Record/cronfa32169 |
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College: |
Faculty of Science and Engineering |
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Issue: |
16 |
Start Page: |
805 |
End Page: |
820 |