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Transient force atomic force microscopy: A new nano-interrogation method / D.R. Sahoo; P. Agarwal; M.V. Salapaka

Proceedings of the American Control Conference

Swansea University Author: Sahoo, Deepak

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DOI (Published version): 10.1109/ACC.2007.4283047

Published in: Proceedings of the American Control Conference
Published: 2007
Online Access: http://www.scopus.com/inward/record.url?eid=2-s2.0-46449110304&partnerID=MN8TOARS
URI: https://cronfa.swan.ac.uk/Record/cronfa32167
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College: College of Science