Conference Paper/Proceeding/Abstract 997 views
Transient force atomic force microscopy: A new nano-interrogation method
D.R. Sahoo,
P. Agarwal,
M.V. Salapaka,
Deepak Sahoo 
Proceedings of the American Control Conference
Swansea University Author:
Deepak Sahoo
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DOI (Published version): 10.1109/ACC.2007.4283047
Abstract
Transient force atomic force microscopy: A new nano-interrogation method
| Published in: | Proceedings of the American Control Conference |
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| Published: |
2007
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| Online Access: |
http://www.scopus.com/inward/record.url?eid=2-s2.0-46449110304&partnerID=MN8TOARS |
| URI: | https://cronfa.swan.ac.uk/Record/cronfa32167 |
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| College: |
Faculty of Science and Engineering |
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