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Conference Paper/Proceeding/Abstract 997 views

Transient force atomic force microscopy: A new nano-interrogation method

D.R. Sahoo, P. Agarwal, M.V. Salapaka, Deepak Sahoo Orcid Logo

Proceedings of the American Control Conference

Swansea University Author: Deepak Sahoo Orcid Logo

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DOI (Published version): 10.1109/ACC.2007.4283047

Published in: Proceedings of the American Control Conference
Published: 2007
Online Access: http://www.scopus.com/inward/record.url?eid=2-s2.0-46449110304&partnerID=MN8TOARS
URI: https://cronfa.swan.ac.uk/Record/cronfa32167
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first_indexed 2017-02-28T13:32:24Z
last_indexed 2018-02-09T05:19:48Z
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spelling 2017-02-28T09:35:22.2653452 v2 32167 2017-02-28 Transient force atomic force microscopy: A new nano-interrogation method c7b57876957049ac9718ff1b265fb2ce 0000-0002-4421-7549 Deepak Sahoo Deepak Sahoo true false 2017-02-28 SCS Conference Paper/Proceeding/Abstract Proceedings of the American Control Conference 31 12 2007 2007-12-31 10.1109/ACC.2007.4283047 http://www.scopus.com/inward/record.url?eid=2-s2.0-46449110304&amp;partnerID=MN8TOARS COLLEGE NANME Computer Science COLLEGE CODE SCS Swansea University 2017-02-28T09:35:22.2653452 2017-02-28T09:35:21.9221462 Faculty of Science and Engineering School of Mathematics and Computer Science - Computer Science D.R. Sahoo 1 P. Agarwal 2 M.V. Salapaka 3 Deepak Sahoo 0000-0002-4421-7549 4
title Transient force atomic force microscopy: A new nano-interrogation method
spellingShingle Transient force atomic force microscopy: A new nano-interrogation method
Deepak Sahoo
title_short Transient force atomic force microscopy: A new nano-interrogation method
title_full Transient force atomic force microscopy: A new nano-interrogation method
title_fullStr Transient force atomic force microscopy: A new nano-interrogation method
title_full_unstemmed Transient force atomic force microscopy: A new nano-interrogation method
title_sort Transient force atomic force microscopy: A new nano-interrogation method
author_id_str_mv c7b57876957049ac9718ff1b265fb2ce
author_id_fullname_str_mv c7b57876957049ac9718ff1b265fb2ce_***_Deepak Sahoo
author Deepak Sahoo
author2 D.R. Sahoo
P. Agarwal
M.V. Salapaka
Deepak Sahoo
format Conference Paper/Proceeding/Abstract
container_title Proceedings of the American Control Conference
publishDate 2007
institution Swansea University
doi_str_mv 10.1109/ACC.2007.4283047
college_str Faculty of Science and Engineering
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hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Mathematics and Computer Science - Computer Science{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Mathematics and Computer Science - Computer Science
url http://www.scopus.com/inward/record.url?eid=2-s2.0-46449110304&amp;partnerID=MN8TOARS
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active_str 0
published_date 2007-12-31T03:39:22Z
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