Journal article 1245 views
Transient-signal-based sample-detection in atomic force microscopy
D.R. Sahoo,
A. Sebastian,
M.V. Salapaka,
Deepak Sahoo 
Applied Physics Letters, Volume: 83, Issue: 26, Pages: 5521 - 5523
Swansea University Author:
Deepak Sahoo
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1063/1.1633963
Abstract
Transient-signal-based sample-detection in atomic force microscopy
| Published in: | Applied Physics Letters |
|---|---|
| ISSN: | 0003-6951 1077-3118 |
| Published: |
2003
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa32171 |
| College: |
Faculty of Science and Engineering |
|---|---|
| Issue: |
26 |
| Start Page: |
5521 |
| End Page: |
5523 |