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Transient-signal-based sample-detection in atomic force microscopy / D.R. Sahoo; A. Sebastian; M.V. Salapaka

Applied Physics Letters, Volume: 83, Issue: 26, Pages: 5521 - 5523

Swansea University Author: Sahoo, Deepak

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DOI (Published version): 10.1063/1.1633963

Published in: Applied Physics Letters
ISSN: 0003-6951 1077-3118
Published: 2003
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URI: https://cronfa.swan.ac.uk/Record/cronfa32171
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College: College of Science
Issue: 26
Start Page: 5521
End Page: 5523