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An observer based sample detection scheme for Atomic Force Microscopy / A Sebastian; DR Sahoo; MV Salapaka;

42nd Ieee Conference on Decision and Control, Vols 1-6, Proceedings

Swansea University Author: Sahoo, Deepak

Published in: 42nd Ieee Conference on Decision and Control, Vols 1-6, Proceedings
Published: 2003
Online Access: http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000189434100367&KeyUID=WOS:000189434100367
URI: https://cronfa.swan.ac.uk/Record/cronfa38933
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College: College of Science