Conference Paper/Proceeding/Abstract 954 views
An observer based sample detection scheme for atomic force microscopy
A. Sebastian,
M.V. Salapaka,
Deepak Sahoo 
42nd IEEE International Conference on Decision and Control (IEEE Cat. No.03CH37475)
Swansea University Author:
Deepak Sahoo
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DOI (Published version): 10.1109/cdc.2003.1272933
Abstract
An observer based sample detection scheme for atomic force microscopy
| Published in: | 42nd IEEE International Conference on Decision and Control (IEEE Cat. No.03CH37475) |
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| ISBN: | 0780379241 |
| Published: |
IEEE
2003
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| Online Access: |
http://dx.doi.org/10.1109/cdc.2003.1272933 |
| URI: | https://cronfa.swan.ac.uk/Record/cronfa38933 |
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| College: |
Faculty of Science and Engineering |
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