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Conference Paper/Proceeding/Abstract 1322 views

An observer based sample detection scheme for atomic force microscopy

A. Sebastian, M.V. Salapaka, Deepak Sahoo Orcid Logo

42nd IEEE International Conference on Decision and Control (IEEE Cat. No.03CH37475)

Swansea University Author: Deepak Sahoo Orcid Logo

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DOI (Published version): 10.1109/cdc.2003.1272933

Published in: 42nd IEEE International Conference on Decision and Control (IEEE Cat. No.03CH37475)
ISBN: 0780379241
Published: IEEE 2003
Online Access: http://dx.doi.org/10.1109/cdc.2003.1272933
URI: https://cronfa.swan.ac.uk/Record/cronfa38933
first_indexed 2018-03-04T20:28:10Z
last_indexed 2020-12-24T03:58:19Z
id cronfa38933
recordtype SURis
fullrecord <?xml version="1.0"?><rfc1807><datestamp>2020-12-23T16:41:10.8406789</datestamp><bib-version>v2</bib-version><id>38933</id><entry>2018-03-04</entry><title>An observer based sample detection scheme for atomic force microscopy</title><swanseaauthors><author><sid>c7b57876957049ac9718ff1b265fb2ce</sid><ORCID>0000-0002-4421-7549</ORCID><firstname>Deepak</firstname><surname>Sahoo</surname><name>Deepak Sahoo</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2018-03-04</date><deptcode>MACS</deptcode><abstract/><type>Conference Paper/Proceeding/Abstract</type><journal>42nd IEEE International Conference on Decision and Control (IEEE Cat. No.03CH37475)</journal><volume/><journalNumber/><paginationStart/><paginationEnd/><publisher>IEEE</publisher><placeOfPublication/><isbnPrint>0780379241</isbnPrint><isbnElectronic/><issnPrint/><issnElectronic/><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2003</publishedYear><publishedDate>2003-12-31</publishedDate><doi>10.1109/cdc.2003.1272933</doi><url>http://dx.doi.org/10.1109/cdc.2003.1272933</url><notes/><college>COLLEGE NANME</college><department>Mathematics and Computer Science School</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>MACS</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2020-12-23T16:41:10.8406789</lastEdited><Created>2018-03-04T18:44:00.4808398</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Mathematics and Computer Science - Computer Science</level></path><authors><author><firstname>A.</firstname><surname>Sebastian</surname><order>1</order></author><author><firstname>M.V.</firstname><surname>Salapaka</surname><order>2</order></author><author><firstname>Deepak</firstname><surname>Sahoo</surname><orcid>0000-0002-4421-7549</orcid><order>3</order></author></authors><documents/><OutputDurs/></rfc1807>
spelling 2020-12-23T16:41:10.8406789 v2 38933 2018-03-04 An observer based sample detection scheme for atomic force microscopy c7b57876957049ac9718ff1b265fb2ce 0000-0002-4421-7549 Deepak Sahoo Deepak Sahoo true false 2018-03-04 MACS Conference Paper/Proceeding/Abstract 42nd IEEE International Conference on Decision and Control (IEEE Cat. No.03CH37475) IEEE 0780379241 31 12 2003 2003-12-31 10.1109/cdc.2003.1272933 http://dx.doi.org/10.1109/cdc.2003.1272933 COLLEGE NANME Mathematics and Computer Science School COLLEGE CODE MACS Swansea University 2020-12-23T16:41:10.8406789 2018-03-04T18:44:00.4808398 Faculty of Science and Engineering School of Mathematics and Computer Science - Computer Science A. Sebastian 1 M.V. Salapaka 2 Deepak Sahoo 0000-0002-4421-7549 3
title An observer based sample detection scheme for atomic force microscopy
spellingShingle An observer based sample detection scheme for atomic force microscopy
Deepak Sahoo
title_short An observer based sample detection scheme for atomic force microscopy
title_full An observer based sample detection scheme for atomic force microscopy
title_fullStr An observer based sample detection scheme for atomic force microscopy
title_full_unstemmed An observer based sample detection scheme for atomic force microscopy
title_sort An observer based sample detection scheme for atomic force microscopy
author_id_str_mv c7b57876957049ac9718ff1b265fb2ce
author_id_fullname_str_mv c7b57876957049ac9718ff1b265fb2ce_***_Deepak Sahoo
author Deepak Sahoo
author2 A. Sebastian
M.V. Salapaka
Deepak Sahoo
format Conference Paper/Proceeding/Abstract
container_title 42nd IEEE International Conference on Decision and Control (IEEE Cat. No.03CH37475)
publishDate 2003
institution Swansea University
isbn 0780379241
doi_str_mv 10.1109/cdc.2003.1272933
publisher IEEE
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Mathematics and Computer Science - Computer Science{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Mathematics and Computer Science - Computer Science
url http://dx.doi.org/10.1109/cdc.2003.1272933
document_store_str 0
active_str 0
published_date 2003-12-31T14:40:37Z
_version_ 1850679637010546688
score 11.08899

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