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Conference contribution 185 views

An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy / D.R. Sahoo; A. Sebastian; M.V. Salapaka

2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004, Volume: 3

Swansea University Author: Sahoo, Deepak

Published in: 2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004
Published: 2004
Online Access: http://www.scopus.com/inward/record.url?eid=2-s2.0-6344282603&partnerID=MN8TOARS
URI: https://cronfa.swan.ac.uk/Record/cronfa38930
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College: College of Science