Conference Paper/Proceeding/Abstract 904 views
An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
D.R. Sahoo,
A. Sebastian,
M.V. Salapaka,
Deepak Sahoo 
2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004, Volume: 3
Swansea University Author:
Deepak Sahoo
Abstract
An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
| Published in: | 2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004 |
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| Published: |
2004
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| Online Access: |
http://www.scopus.com/inward/record.url?eid=2-s2.0-6344282603&partnerID=MN8TOARS |
| URI: | https://cronfa.swan.ac.uk/Record/cronfa38930 |
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| College: |
Faculty of Science and Engineering |
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