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Conference Paper/Proceeding/Abstract 1187 views

An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy

D.R. Sahoo, A. Sebastian, M.V. Salapaka, Deepak Sahoo Orcid Logo

2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004, Volume: 3

Swansea University Author: Deepak Sahoo Orcid Logo

Published in: 2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004
Published: 2004
Online Access: http://www.scopus.com/inward/record.url?eid=2-s2.0-6344282603&partnerID=MN8TOARS
URI: https://cronfa.swan.ac.uk/Record/cronfa38930
first_indexed 2018-03-04T20:28:10Z
last_indexed 2018-03-04T20:28:10Z
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spelling 2018-03-04T18:43:53.3670707 v2 38930 2018-03-04 An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy c7b57876957049ac9718ff1b265fb2ce 0000-0002-4421-7549 Deepak Sahoo Deepak Sahoo true false 2018-03-04 MACS Conference Paper/Proceeding/Abstract 2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004 3 31 12 2004 2004-12-31 http://www.scopus.com/inward/record.url?eid=2-s2.0-6344282603&amp;partnerID=MN8TOARS COLLEGE NANME Mathematics and Computer Science School COLLEGE CODE MACS Swansea University 2018-03-04T18:43:53.3670707 2018-03-04T18:43:53.3670707 Faculty of Science and Engineering School of Mathematics and Computer Science - Computer Science D.R. Sahoo 1 A. Sebastian 2 M.V. Salapaka 3 Deepak Sahoo 0000-0002-4421-7549 4
title An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
spellingShingle An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
Deepak Sahoo
title_short An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
title_full An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
title_fullStr An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
title_full_unstemmed An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
title_sort An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
author_id_str_mv c7b57876957049ac9718ff1b265fb2ce
author_id_fullname_str_mv c7b57876957049ac9718ff1b265fb2ce_***_Deepak Sahoo
author Deepak Sahoo
author2 D.R. Sahoo
A. Sebastian
M.V. Salapaka
Deepak Sahoo
format Conference Paper/Proceeding/Abstract
container_title 2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004
container_volume 3
publishDate 2004
institution Swansea University
college_str Faculty of Science and Engineering
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hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Mathematics and Computer Science - Computer Science{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Mathematics and Computer Science - Computer Science
url http://www.scopus.com/inward/record.url?eid=2-s2.0-6344282603&amp;partnerID=MN8TOARS
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published_date 2004-12-31T14:40:33Z
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