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Conference Paper/Proceeding/Abstract 768 views

An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy

D.R. Sahoo, A. Sebastian, M.V. Salapaka, Deepak Sahoo Orcid Logo

2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004, Volume: 3

Swansea University Author: Deepak Sahoo Orcid Logo

Published in: 2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004
Published: 2004
Online Access: http://www.scopus.com/inward/record.url?eid=2-s2.0-6344282603&partnerID=MN8TOARS
URI: https://cronfa.swan.ac.uk/Record/cronfa38930
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last_indexed 2018-03-04T20:28:10Z
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fullrecord <?xml version="1.0"?><rfc1807><datestamp>2018-03-04T18:43:53.3670707</datestamp><bib-version>v2</bib-version><id>38930</id><entry>2018-03-04</entry><title>An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy</title><swanseaauthors><author><sid>c7b57876957049ac9718ff1b265fb2ce</sid><ORCID>0000-0002-4421-7549</ORCID><firstname>Deepak</firstname><surname>Sahoo</surname><name>Deepak Sahoo</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2018-03-04</date><deptcode>SCS</deptcode><abstract/><type>Conference Paper/Proceeding/Abstract</type><journal>2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004</journal><volume>3</volume><journalNumber></journalNumber><paginationStart/><paginationEnd/><publisher/><placeOfPublication/><isbnPrint/><isbnElectronic/><issnPrint/><issnElectronic/><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2004</publishedYear><publishedDate>2004-12-31</publishedDate><doi/><url>http://www.scopus.com/inward/record.url?eid=2-s2.0-6344282603&amp;amp;partnerID=MN8TOARS</url><notes/><college>COLLEGE NANME</college><department>Computer Science</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>SCS</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2018-03-04T18:43:53.3670707</lastEdited><Created>2018-03-04T18:43:53.3670707</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Mathematics and Computer Science - Computer Science</level></path><authors><author><firstname>D.R.</firstname><surname>Sahoo</surname><order>1</order></author><author><firstname>A.</firstname><surname>Sebastian</surname><order>2</order></author><author><firstname>M.V.</firstname><surname>Salapaka</surname><order>3</order></author><author><firstname>Deepak</firstname><surname>Sahoo</surname><orcid>0000-0002-4421-7549</orcid><order>4</order></author></authors><documents/><OutputDurs/></rfc1807>
spelling 2018-03-04T18:43:53.3670707 v2 38930 2018-03-04 An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy c7b57876957049ac9718ff1b265fb2ce 0000-0002-4421-7549 Deepak Sahoo Deepak Sahoo true false 2018-03-04 SCS Conference Paper/Proceeding/Abstract 2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004 3 31 12 2004 2004-12-31 http://www.scopus.com/inward/record.url?eid=2-s2.0-6344282603&amp;partnerID=MN8TOARS COLLEGE NANME Computer Science COLLEGE CODE SCS Swansea University 2018-03-04T18:43:53.3670707 2018-03-04T18:43:53.3670707 Faculty of Science and Engineering School of Mathematics and Computer Science - Computer Science D.R. Sahoo 1 A. Sebastian 2 M.V. Salapaka 3 Deepak Sahoo 0000-0002-4421-7549 4
title An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
spellingShingle An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
Deepak Sahoo
title_short An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
title_full An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
title_fullStr An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
title_full_unstemmed An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
title_sort An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
author_id_str_mv c7b57876957049ac9718ff1b265fb2ce
author_id_fullname_str_mv c7b57876957049ac9718ff1b265fb2ce_***_Deepak Sahoo
author Deepak Sahoo
author2 D.R. Sahoo
A. Sebastian
M.V. Salapaka
Deepak Sahoo
format Conference Paper/Proceeding/Abstract
container_title 2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004
container_volume 3
publishDate 2004
institution Swansea University
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Mathematics and Computer Science - Computer Science{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Mathematics and Computer Science - Computer Science
url http://www.scopus.com/inward/record.url?eid=2-s2.0-6344282603&amp;partnerID=MN8TOARS
document_store_str 0
active_str 0
published_date 2004-12-31T03:49:24Z
_version_ 1763752400327278592
score 10.998093

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