No Cover Image

Conference Paper/Proceeding/Abstract 816 views

An Observer Based Sample Detection Scheme for Atomic Force Microscopy

A. Sebastian, D.R. Sahoo, M.V. Salapaka, Deepak Sahoo Orcid Logo

Proceedings of the IEEE Conference on Decision and Control, Volume: 3

Swansea University Author: Deepak Sahoo Orcid Logo

Published in: Proceedings of the IEEE Conference on Decision and Control
Published: 2003
Online Access: http://www.scopus.com/inward/record.url?eid=2-s2.0-1542349121&partnerID=MN8TOARS
URI: https://cronfa.swan.ac.uk/Record/cronfa38932
Tags: Add Tag
No Tags, Be the first to tag this record!
first_indexed 2018-03-04T20:28:10Z
last_indexed 2018-03-04T20:28:10Z
id cronfa38932
recordtype SURis
fullrecord <?xml version="1.0"?><rfc1807><datestamp>2018-03-04T18:43:58.5931874</datestamp><bib-version>v2</bib-version><id>38932</id><entry>2018-03-04</entry><title>An Observer Based Sample Detection Scheme for Atomic Force Microscopy</title><swanseaauthors><author><sid>c7b57876957049ac9718ff1b265fb2ce</sid><ORCID>0000-0002-4421-7549</ORCID><firstname>Deepak</firstname><surname>Sahoo</surname><name>Deepak Sahoo</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2018-03-04</date><deptcode>SCS</deptcode><abstract/><type>Conference Paper/Proceeding/Abstract</type><journal>Proceedings of the IEEE Conference on Decision and Control</journal><volume>3</volume><journalNumber></journalNumber><paginationStart/><paginationEnd/><publisher/><placeOfPublication/><isbnPrint/><isbnElectronic/><issnPrint/><issnElectronic/><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2003</publishedYear><publishedDate>2003-12-31</publishedDate><doi/><url>http://www.scopus.com/inward/record.url?eid=2-s2.0-1542349121&amp;amp;partnerID=MN8TOARS</url><notes/><college>COLLEGE NANME</college><department>Computer Science</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>SCS</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2018-03-04T18:43:58.5931874</lastEdited><Created>2018-03-04T18:43:58.5931874</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Mathematics and Computer Science - Computer Science</level></path><authors><author><firstname>A.</firstname><surname>Sebastian</surname><order>1</order></author><author><firstname>D.R.</firstname><surname>Sahoo</surname><order>2</order></author><author><firstname>M.V.</firstname><surname>Salapaka</surname><order>3</order></author><author><firstname>Deepak</firstname><surname>Sahoo</surname><orcid>0000-0002-4421-7549</orcid><order>4</order></author></authors><documents/><OutputDurs/></rfc1807>
spelling 2018-03-04T18:43:58.5931874 v2 38932 2018-03-04 An Observer Based Sample Detection Scheme for Atomic Force Microscopy c7b57876957049ac9718ff1b265fb2ce 0000-0002-4421-7549 Deepak Sahoo Deepak Sahoo true false 2018-03-04 SCS Conference Paper/Proceeding/Abstract Proceedings of the IEEE Conference on Decision and Control 3 31 12 2003 2003-12-31 http://www.scopus.com/inward/record.url?eid=2-s2.0-1542349121&amp;partnerID=MN8TOARS COLLEGE NANME Computer Science COLLEGE CODE SCS Swansea University 2018-03-04T18:43:58.5931874 2018-03-04T18:43:58.5931874 Faculty of Science and Engineering School of Mathematics and Computer Science - Computer Science A. Sebastian 1 D.R. Sahoo 2 M.V. Salapaka 3 Deepak Sahoo 0000-0002-4421-7549 4
title An Observer Based Sample Detection Scheme for Atomic Force Microscopy
spellingShingle An Observer Based Sample Detection Scheme for Atomic Force Microscopy
Deepak Sahoo
title_short An Observer Based Sample Detection Scheme for Atomic Force Microscopy
title_full An Observer Based Sample Detection Scheme for Atomic Force Microscopy
title_fullStr An Observer Based Sample Detection Scheme for Atomic Force Microscopy
title_full_unstemmed An Observer Based Sample Detection Scheme for Atomic Force Microscopy
title_sort An Observer Based Sample Detection Scheme for Atomic Force Microscopy
author_id_str_mv c7b57876957049ac9718ff1b265fb2ce
author_id_fullname_str_mv c7b57876957049ac9718ff1b265fb2ce_***_Deepak Sahoo
author Deepak Sahoo
author2 A. Sebastian
D.R. Sahoo
M.V. Salapaka
Deepak Sahoo
format Conference Paper/Proceeding/Abstract
container_title Proceedings of the IEEE Conference on Decision and Control
container_volume 3
publishDate 2003
institution Swansea University
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Mathematics and Computer Science - Computer Science{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Mathematics and Computer Science - Computer Science
url http://www.scopus.com/inward/record.url?eid=2-s2.0-1542349121&amp;partnerID=MN8TOARS
document_store_str 0
active_str 0
published_date 2003-12-31T03:49:24Z
_version_ 1763752400570548224
score 11.021648

Similar Items