Conference Paper/Proceeding/Abstract 816 views
An Observer Based Sample Detection Scheme for Atomic Force Microscopy
Proceedings of the IEEE Conference on Decision and Control, Volume: 3
Swansea University Author:
Deepak Sahoo
Abstract
An Observer Based Sample Detection Scheme for Atomic Force Microscopy
Published in: | Proceedings of the IEEE Conference on Decision and Control |
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Published: |
2003
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Online Access: |
http://www.scopus.com/inward/record.url?eid=2-s2.0-1542349121&partnerID=MN8TOARS |
URI: | https://cronfa.swan.ac.uk/Record/cronfa38932 |
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College: |
Faculty of Science and Engineering |
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