Conference Paper/Proceeding/Abstract 908 views
An Observer Based Sample Detection Scheme for Atomic Force Microscopy
A. Sebastian,
D.R. Sahoo,
M.V. Salapaka,
Deepak Sahoo 
Proceedings of the IEEE Conference on Decision and Control, Volume: 3
Swansea University Author:
Deepak Sahoo
Abstract
An Observer Based Sample Detection Scheme for Atomic Force Microscopy
| Published in: | Proceedings of the IEEE Conference on Decision and Control |
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| Published: |
2003
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| Online Access: |
http://www.scopus.com/inward/record.url?eid=2-s2.0-1542349121&partnerID=MN8TOARS |
| URI: | https://cronfa.swan.ac.uk/Record/cronfa38932 |
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| College: |
Faculty of Science and Engineering |
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