Journal article 915 views
An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
DR Sahoo,
A Sebastian,
MV Salapaka,
M Laudon,
B Romanowicz,
Deepak Sahoo 
Nsti Nanotech 2004, Vol 3, Technical Proceedings
Swansea University Author:
Deepak Sahoo
Abstract
An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
| Published in: | Nsti Nanotech 2004, Vol 3, Technical Proceedings |
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| Published: |
2004
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| Online Access: |
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000223078200004&KeyUID=WOS:000223078200004 |
| URI: | https://cronfa.swan.ac.uk/Record/cronfa38931 |
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| College: |
Faculty of Science and Engineering |
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