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An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy

DR Sahoo, A Sebastian, MV Salapaka, M Laudon, B Romanowicz, Deepak Sahoo Orcid Logo

Nsti Nanotech 2004, Vol 3, Technical Proceedings

Swansea University Author: Deepak Sahoo Orcid Logo

Published in: Nsti Nanotech 2004, Vol 3, Technical Proceedings
Published: 2004
Online Access: http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000223078200004&KeyUID=WOS:000223078200004
URI: https://cronfa.swan.ac.uk/Record/cronfa38931
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last_indexed 2018-03-04T20:28:10Z
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spelling 2018-03-04T18:43:56.4403556 v2 38931 2018-03-04 An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy c7b57876957049ac9718ff1b265fb2ce 0000-0002-4421-7549 Deepak Sahoo Deepak Sahoo true false 2018-03-04 SCS Journal Article Nsti Nanotech 2004, Vol 3, Technical Proceedings 31 12 2004 2004-12-31 http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&amp;SrcAuth=ORCID&amp;SrcApp=OrcidOrg&amp;DestLinkType=FullRecord&amp;DestApp=WOS_CPL&amp;KeyUT=WOS:000223078200004&amp;KeyUID=WOS:000223078200004 COLLEGE NANME Computer Science COLLEGE CODE SCS Swansea University 2018-03-04T18:43:56.4403556 2018-03-04T18:43:56.4403556 Faculty of Science and Engineering School of Mathematics and Computer Science - Computer Science DR Sahoo 1 A Sebastian 2 MV Salapaka 3 M Laudon 4 B Romanowicz 5 Deepak Sahoo 0000-0002-4421-7549 6
title An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
spellingShingle An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
Deepak Sahoo
title_short An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
title_full An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
title_fullStr An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
title_full_unstemmed An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
title_sort An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy
author_id_str_mv c7b57876957049ac9718ff1b265fb2ce
author_id_fullname_str_mv c7b57876957049ac9718ff1b265fb2ce_***_Deepak Sahoo
author Deepak Sahoo
author2 DR Sahoo
A Sebastian
MV Salapaka
M Laudon
B Romanowicz
Deepak Sahoo
format Journal article
container_title Nsti Nanotech 2004, Vol 3, Technical Proceedings
publishDate 2004
institution Swansea University
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Mathematics and Computer Science - Computer Science{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Mathematics and Computer Science - Computer Science
url http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&amp;SrcAuth=ORCID&amp;SrcApp=OrcidOrg&amp;DestLinkType=FullRecord&amp;DestApp=WOS_CPL&amp;KeyUT=WOS:000223078200004&amp;KeyUID=WOS:000223078200004
document_store_str 0
active_str 0
published_date 2004-12-31T03:49:24Z
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score 11.035634

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